X-ray Crystallography
X-ray Crystallography
The X-ray Crystallography Facility provides services and resources related to X-ray diffraction analysis of crystalline materials for researchers at Purdue as well as off-site users and commercial customers. The facility offers full data collection and structure analysis services, and trains users to independently use the resources on site. Types of analysis include single crystal structure analysis for organic, inorganic, metal organic and hybrid materials (indexing, unit cell and structure determinations, absolute structure), powder and multicrystalline XRD (phase ID, Rietveld analysis, high temperature measurements, thin film measurements, X-ray reflectivity). Starting Fall 2019, we will also offer X-ray fluorescence analysis. – Panalytical Empyrean Powder X-ray Diffractometer. Equipped with both parallel beam and focusing optics, high speed PIXcel 3D Medipix detector and high temperature stage for analysis of powders, multicrystalline materials and thin films. – Two Bruker D8 Quest Single Crystal Diffractometers equipped with large Photon detectors and variable temperature devices. The Mo-wavelength instrument is ideal for fast, high throughput data collection of well to weakly diffracting samples, and for heavily absorbing samples. The Cu-wavelength microsource instrument is ideal for very weakly diffracting and small crystals and absolute structure determination.
- Category: Science
- Recharge: Yes
- Accessible to non-Purdue users: Yes
- Contact: Matthias Zeller